AFMs for Your Needs

• Interested?
• Phone +49 0174 2433130
• Deutsche Version

---

Applications

DME Channel on YouTube

News

• Publications about Thermal Microscopy
  In the last months, some articles about Thermal Microscopy are published, which you can find under SEM AFM Applications.

• ---

• The new controller C32 is available
  The C32 controller offers many new possibilities for AFM measurements.
  More...

The world seen by DME instruments - SEM-AFM

Application examples

• Zeiss AFM option as analyzing tool for nanostructures generated by Zeiss ORION NanoFab
• Electrical investigation of buried interfaces by Scanning Kelvin Probe Force Microscopy in a FIB-SEM-AFM system
• Characterize electrical properties quantitatively


• Publications of customers
• Videos


• Description of the SEM-AFM and the measurement methods

Images galery

Scanning suspended Graphene on pillars

Scanning the sidewall of a single GaN based nanorod

Scanning puder

Publications of customers

• V. Leitgeb, R. Hammer, L. Mitterhuber, K. Fladischer, F. Peter, A. Buerke, S. Defregger
  Thermal and spatial resolution in scanning thermal microscopy images: A study on the probe's heating parameters , Journal of Applied Physics 129, 164502 (2021)


• Katrin Fladischer, Verena Leitgeb, Lisa Mitterhuber, Günther A.Maier, Jozef Keckes, Martin Sagmeister, Sara Carniello, Stefan Defregger
  Combined thermo-physical investigations of thin layers with Time Domain Thermoreflectance and Scanning Thermal Microscopy on the example of 500 nm thin, CVD grown tungsten, Thermochimica Acta 2019


• Verena Leitgeb, Katrin Fladischer, Frank Hitzel, Florentyna Sosada-Ludwikowska, Johanna Krainer, Robert Wimmer-Teubenbacher, Anton Köck,
  SPM-SEM Investigations of Semiconductor Nanowires for Integrated Metal Oxide Gas Sensors, Proceedings 2018, 2(13), 701


• Frank Hitzel, Verena Leitgeb, Sabine Lenz,
  Enabling Scanning Thermal Microscopy in the SEM with an in situ AFM, Zeiss - Technical Note


• Hyosik Kang, Jaehan Lee, Thomas Rodgers, Jae-Hyun Shim, Sanghun Lee,
  Electrical Conductivity of Delithiated Lithium Cobalt Oxides: Conductive Atomic Force Microscopy and Density Functional Theory Study, J. Phys. Chem. C, Volume 123, 2019, Pages 17703−17710


• Rebecca Saive, Michael Scherer, Christian Mueller, Dominik Daume, Janusz Schinke, Michael Kroeger, Wolfgang Kowalsky,
  Imaging the electric potential within organic solar cells, Advanced Functional Materials Volume 23, Issue 47, December 2013, Pages 5854-5860


• Rebecca Saive, Christian Mueller, Janusz Schinke, Robert Lovrincic, Wolfgang Kowalsky,
  Understanding S-shaped current-voltage characteristics of organic solar cells: Direct measurement of potential distributions by scanning Kelvin probe, Applied Physics Letters, Volume 103, Issue 24, December 2013


• Rebecca Saive, Lars Mueller, Eric Mankel, Wolfgang Kowalsky, Michael Kroeger,
  Doping of TIPS-pentacene via Focused Ion Beam (FIB) exposure, Organic Electronics, Volume 14, Issue 6, June 2013, Pages 1570-1576


• Michael Scherer, Rebecca Saive, Dominik Daume, Michael Kroeger, Wolfgang Kowalsky,
  Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells, AIP Advances, Volume 3, Issue 9, September 2013


• Jeong-Won Seok, Jaehan Lee, Thomas Rodgers, Dong-Hwan Ko, Jae-Hyun Shim,
  Effect of LiPO₂F₂ Electrolyte Additive on Surface Electrical Properties of LiNi_0.6Co_0.2Mn_0.2O₂ Cathode, Transactions on Electrical and Electronic Materials, 2019


• Jae-Hyun Shim, Ki-Soo Lee, Alexander Missyul, Jaehan Lee, Bruno Linn, Eun Cheol Lee, Sanghun Lee,
  Characterization of Spinel Li_xCo₂O₄-Coated LiCoO₂ Prepared with Post-Thermal Treatment as a Cathode Material for Lithium Ion Batteries, Chemistry of Materials, Volume 27, Issue 9, May 2015, Pages 3177-3546