Dedicated Products for ZEISS FE-SEMs
Fully Integrated SEM-AFM Combination
Highest Performance:
- SEM guided positioning of AFM tip to area of interest
- all AFM modes available
- anchored stage technology for ultra high stability and low drift
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Ease of use:
- one software interface to operate AFM and SEM
- automated laser and detector alignment
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Flexibility:
- sample scanner setup with 9 µm or 25 µm scan range
- sample size up to 10 mm
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| Versatility:
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| Further information:
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Protect your sample from air exposure
Highest Performance:
- safe and easy transfer of delicate samples between the SEM and the facilities for sample storage
and preparation, e.g. a glovebox or glove bag.
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Ease of use:
- infrared remote control for opening and closing the Sample Transfer Shuttle
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Flexibility:
- Shuttle chamber can be filled with an inert gas atmosphere or pumped to vaccum by a manual valve
- Samples can be mounted either to standard SEM sample plugs (max. sample size 10 mm x 10 mm x 2 mm) or
to the provided transferable holder, also used in the SEM-AFM (max. sample size 10 mm x 10 mm x 6 mm).
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Versatility:
- Protection for batteries, fuel cells, thin or etched films, organic electronics, some sort
of semiconductors, hydrophilic crystals and many more, i.e. all air sensitive samples which
should be protected from influences like oxidation, corrosion, moisture, or contamination
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Position your sample with submicron precision
Highest Performance:
- Navigate the sample more precise over large distances
- Increase speed, resolution and decrease data volume
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Ease of use:
- Operate the high precision stage the same way as the standard ZEISS stage
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Flexibility:
- Carry out automated, multidetector analysis
- Find and refind procedures can be carried out with much higher reliability
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Versatility:
- Correlative Measurement Software
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| Further information:
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