The world seen by DME instruments - Electrical properties
- Nano particles on silicon: topography (left) and work function, KFPM, (right) are measured simultaneously.
- Multilayer condensator:
top: topography (left) and work function, KFPM, (right) are measured simultaneously
bottom: Superposition of both images: topography as 3D structure, KPFM colour coded
Publications of customers
- Rebecca Saive, Michael Scherer, Christian Mueller, Dominik Daume, Janusz Schinke, Michael Kroeger, Wolfgang Kowalsky,
Imaging the electric potential within organic solar cells,
Advanced Functional Materials Volume 23, Issue 47, December 2013, Pages 5854-5860
- Rebecca Saive, Christian Mueller, Janusz Schinke, Robert Lovrincic, Wolfgang Kowalsky,
Understanding
S-shaped current-voltage characteristics of organic solar cells: Direct measurement of potential
distributions by scanning Kelvin probe,
Applied Physics Letters, Volume 103, Issue 24, December 2013
- Michael Scherer, Rebecca Saive, Dominik Daume, Michael Kroeger, Wolfgang Kowalsky,
Sample preparation
for scanning Kelvin probe microscopy studies on cross sections of organic solar cells,
AIP Advances, Volume 3, Issuer 9, September 2013
- K. Vels Hansen, Y. Wu, T. Jacobsen, M. B. Mogensen, L. Theil Kuhn
Improved controlled
atmosphere high temperature scanning probe microscope,
Review of Scientific Instruments, Volume 84, Issue 7, 2013
- Rebecca Saive, Lars Mueller, Eric Mankel, Wolfgang Kowalsky, Michael Kroeger,
Doping of TIPS-pentacene via Focused Ion Beam (FIB) exposure,
Organic Electronics, Volume 14, Issue 6, June 2013, Pages 1570-1576
